c-Alice

AI-powered image-based classification for optimized process control and fast root cause analysis.

Download Data sheet

c-Alice

AI-powered image-based classification for optimized process control and fast root cause analysis.

Download Data sheet

Unlock the value of every image with AI

c-Alice is an AI-powered image classification app, built for complex production environments that depend on high-volume image data from multiple systems for quality control.

Results go straight to your  IoT Data Platform or reporting and control tools – just where and when you need them, which leads to optimized process control and fast root cause analysis.

"After a quick implementation into our infrastructure, we can use c-Alice to automatically evaluate images at many monitoring points in the manufacturing process. The application is easy to use, so engineers and technicians are able to implement their specific use cases themselves. By using c-Alice, we have already been able to identify several process problems at an early stage and save considerable costs by significantly improving yields."

Dejan Simic Head of Metrology at Semikron-Danfoss

"With c-Alice, we are able to evaluate the data generated during our inspection processes more accurately and reliably. We can detect errors at different levels in the production process, we can see at which levels they occur and whether they are ultimately relevant to the product. Our experts can apply AI methods in a simple and intuitive way and transfer their knowledge to so-called recipes, which can be created, configured, trained, released and implemented using a simple workflow."

Site manager Jörg Amelung and defect density engineer Juliane Weise at Fraunhofer IPMS

Why c-Alice?

  • Transforms images into insights for decision-making
  • Works with all types of images
  • Supports many different use cases
  • Easy to use – no AI expertise required
  • Reduces costs & resources – Fast ROI
  • Fast root cause analysis – fewer defects, higher yield
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Fast and accurate AI-powered image classification in seconds

  • Classification Tasks (Known Defects): Identification and categorization of defect types in images with reduced false positives.
  • Anomaly Detection (Unknown Defects): Identify unexpected deviations beyond predefined defect categories.
  • Pattern Analysis: Recognition of signatures in defect and wafer maps.
  • Object Detection: Counting, position verification, and completeness checks.
  • And beyond: New capabilities are constantly being added as we evolve with customer needs and production challenges.

 

Easy to Use.
Built to Fit.

Everything inside c-Alice is designed to work intuitively for engineers and technicians – without requiring AI knowledge or code. The system adapts to your production setup with maximum flexibility.

For all image types

Any type of inspection / microscopy, wafer maps, test maps and others.

Easy to set-up

Easily adjust, monitor, and expand AI models without in-depth AI knowledge.

Highly efficient

Low maintenance, increases throughput and reduces personel requirements.

Full transparency for ...

Image Managing

To organize images with their meta data and classify them.

Training Results

To improve, monitor or deploy trained recipes.

Recipe Management

To version, organize and deploy recipes for full traceability.

Result Treatment

To feed result data exactly where you need them.

Leverage AI for faster feedback loops, higher production quality and saved resources.

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